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1

[IEEE 2010 10th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering - APEIE - Novosibirsk, Russia (2010.09.22-2010.09.24)] 2010 10th International Conference on Actual Problems of Electronic Instrument Engineering APEIE-2010 - Measurements in educational processes

Serikh, V.I., Yakimova, I.V., Palchun, Yu.A.

Year:

2010

Language:

english

File:

PDF, 431 KB

english, 2010

2

Use of simulation modelling for checking monitoring and testing procedures

S. B. Danilevich, S. S. Kolesnikov, Yu. A. Palchun

Journal:

Measurement Techniques

Year:

2011

Language:

english

File:

PDF, 128 KB

english, 2011

3

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - System models of metrological support and manufacturing control

Palchun, Yu. A., Yelistratova, I. B.

Year:

2012

Language:

english

File:

PDF, 459 KB

english, 2012

4

[IEEE 2010 10th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering - APEIE - Novosibirsk, Russia (2010.09.22-2010.09.24)] 2010 10th International Conference on Actual Problems of Electronic Instrument Engineering APEIE-2010 - Bases of the theory of measurements in quality management systems

Palchun, Yu.A., Serikh, V.I.

Year:

2010

Language:

english

File:

PDF, 527 KB

english, 2010

5

[IEEE 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2014.10.2-2014.10.4)] 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Stability analysis systems of the metrological providing and managements

Palchun, Yu. A., Yelistratova, I. B.

Year:

2014

Language:

english

File:

PDF, 760 KB

english, 2014

6

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Optimization of systems of metrological procurement and production control

Palchun, Yu. A., Elistratova, I. B.

Year:

2012

Language:

russian

File:

PDF, 307 KB

russian, 2012

7

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Application of S-graphs for modeling systems of metrological procurement and control

Palchun, Yu. A., Elistratova, I. B., Yakimova, I. V., Zemtsov, S. P., Kvitkova, I. G.

Year:

2012

Language:

russian

File:

PDF, 373 KB

russian, 2012

8

[IEEE 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2014.10.2-2014.10.4)] 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Using spline-function for the reason unceasing description of the metrological features of the measures ORF

Sibirtsev, S.N., Romasko, S.V., Palchun, A.Yu.

Year:

2014

File:

PDF, 909 KB

2014

9

[IEEE 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering - Novosibirsk, Russia (2006.09.26-2006.09.28)] 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering - Principal Questions of Management for Interaction of Process for QMS

Serykh, V.I., Egiazaryan, G.G., Palchun, Yu.A.

Year:

2006

Language:

english

File:

PDF, 78 KB

english, 2006

10

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Models for systems of metrological procurement and production processes control

Palchun, Yu. A., Elistratova, I. B.

Year:

2012

Language:

russian

File:

PDF, 359 KB

russian, 2012

11

[IEEE 2010 10th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering - APEIE - Novosibirsk, Russia (2010.09.22-2010.09.24)] 2010 10th International Conference on Actual Problems of Electronic Instrument Engineering APEIE-2010 - The analysis and modelling processes of hi-tech manufacture

Elistratova, I.B., Palchun, Yu.A., Pyzhov, P.I., Kvitkova, I.G.

Year:

2010

Language:

english

File:

PDF, 254 KB

english, 2010

12

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Analysis and study of uncertainties of the models for systems of metrological procurement and production control

Palchun, Yu. A., Elistratova, I. B.

Year:

2012

Language:

russian

File:

PDF, 192 KB

russian, 2012

13

Reliability of measurement monitoring including specifications for the indicators of measurement accuracy

V. I. Serykh, Yu. A. Palchun, I. G. Kvitkova

Journal:

Measurement Techniques

Year:

2011

Language:

english

File:

PDF, 202 KB

english, 2011

14

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - The optimization of metrological systems of ensuring and management of production

Palchun, Yu. A., Yelistratova, I.

Year:

2012

Language:

english

File:

PDF, 429 KB

english, 2012

15

[IEEE 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering - Novosibirsk, Russia (2006.09.26-2006.09.28)] 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering - Process Approach to Qualiti Management System

Elistratova, I. B., Palchun, Yu.A.

Year:

2006

Language:

english

File:

PDF, 82 KB

english, 2006

16

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Generalized analysis of reflection parameters meters

Palchun, Yu. A., Evgrafov, V. I., Kaverin, A. M., Vladimirova, S. V.

Year:

2012

Language:

russian

File:

PDF, 387 KB

russian, 2012

17

[IEEE 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2014.10.2-2014.10.4)] 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Using spline-function for the reason unceasing description of the metrological features of the measures ORF

Sibirtsev, S.N., Romasko, S.V., Palchun, A.Yu.

Year:

2014

Language:

english

File:

PDF, 909 KB

english, 2014

18

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - The generalized analysis of parameters measurement of processes in QMS

Palchun, Yu. A., Serikh, V. I., Yakimova, I. V., Kvitkova, I. G.

Year:

2012

Language:

english

File:

PDF, 295 KB

english, 2012

19

[IEEE 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering - Novosibirsk, Russia (2006.09.26-2006.09.28)] 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering - Analysis of Generalized Mathematical Models for QMS

Serykh, V.I., Egiazaryan, G.G., Palchun, Yu.A.

Year:

2006

Language:

english

File:

PDF, 78 KB

english, 2006

20

[IEEE 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering - Novosibirsk, Russia (2006.09.26-2006.09.28)] 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering - Connectors and Problems in its Metrological Provision SHF Measurements on Modern Stage

Evgrafov, V.I., Kondakov, V.Yu., Konyshev, A.V., Palchun, Yu.A., Trubekhina, A.G., Khvorostov, B.A., Ryzhkov, I.A., Miroshnichenko, A.N.

Year:

2006

Language:

english

File:

PDF, 91 KB

english, 2006

21

[IEEE 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2014.10.2-2014.10.4)] 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Siberian Research Institute of Metrology. Stages of 70-year-old way and today tasks

Shuvalov, G.V., Evgrafov, V.I., Cherepanov, V.Ya., Palchun, Yu.A.

Year:

2014

Language:

english

File:

PDF, 1.34 MB

english, 2014

22

Monitoring and methods of early diagnostics of damage to optical fibers

Yu. A. Palchun, N. Yu. Sitnov, N. I. Gorlov

Journal:

Measurement Techniques

Year:

2010

Language:

english

File:

PDF, 141 KB

english, 2010

23

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Applying S-graphs for modeling metrological support and control systems

Palchun, Yu. A., Yelistratova, I. B., Yakimova, I. V., Zemtsov, C. P., Kvitkova, I. G.

Year:

2012

Language:

english

File:

PDF, 431 KB

english, 2012

24

[IEEE 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2014.10.2-2014.10.4)] 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Analysis and research of uncertainty of systems of metrological ensuring and management of production

Palchun, Yu.A., Yelistratova, I. B.

Year:

2014

Language:

english

File:

PDF, 778 KB

english, 2014

25

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Generalized analysis of processes parameters measurement in SQM

Palchun, Yu. A, Serykh, V. I., Yakimova, I. V., Kvitkova, I. G.

Year:

2012

Language:

russian

File:

PDF, 99 KB

russian, 2012

26

Mathematical analysis of the uhf range for a half-wave balanced transformer

Yu. A. Palchun, V. I. Sedinin, S. A. Goncharov

Journal:

Measurement Techniques

Year:

2009

Language:

english

File:

PDF, 210 KB

english, 2009

27

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Analysis and research of uncertainty of systems of metrological ensuring and management of production

Palchun, Yu. A., Yelistratova, I. B.

Year:

2012

Language:

english

File:

PDF, 417 KB

english, 2012

28

[IEEE 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2014.10.2-2014.10.4)] 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - By estimating parameters of distribution lines and devices in the range of radio waves supply substations telecommunications facilities, taking into account switching noise and lightning

Pologrudov, V.P., Malinkin, V.B., Palchun, A.Yu., Palchun, Yu.A., Remizov, S.L.

Year:

2014

Language:

english

File:

PDF, 1.02 MB

english, 2014

29

[IEEE 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2014.10.2-2014.10.4)] 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Protection of telecommunication systems from lightning via pin diverter

Pologrudov, V.P., Malinkin, V.B., Palchun, A. Yu., Palchun, U Yu.A., Remizov, S.L.

Year:

2014

Language:

english

File:

PDF, 629 KB

english, 2014

30

[IEEE 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2016.10.3-2016.10.6)] 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Analysis of high-precision microwave used by calibration of meters parameters transfer in coaxial tract

Palchun, Yuri A., Elistratova, Irina B., Palchun, Alexei Yu, Kvitkova, Irina G., Gayvonenko, Alexandra E.

Year:

2016

Language:

english

File:

PDF, 226 KB

english, 2016

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